Yes! Atomic force microscopy (AFM) is indeed a three-dimensional (3D) imaging technique.
AFM works by scanning a sharp tip over a surface. The tip is attached to a cantilever, which is a small beam that bends or deflects as the tip interacts with the sample's surface. This bending is measured and used to create an image of the surface. The key to its 3D capability lies in how it acquires data:
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X and Y Dimensions: The tip scans the surface laterally, providing information about the sample's features in the X and Y dimensions (horizontal plane).
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Z Dimension: As the tip encounters variations in the sample's height, the cantilever bends up or down. Sensors measure this deflection in the Z dimension (vertical plane). This provides height information, which is crucial for creating a 3D representation.
In essence, AFM collects topography data (height information in the Z direction) while simultaneously scanning laterally (position information in the X and Y directions). This combination enables the creation of a 3D image, revealing the surface's features and their corresponding heights.
