A Transmission Electron Microscope (TEM) can achieve a maximum magnification of more than 50 million times.
TEMs offer significantly higher magnification capabilities compared to Scanning Electron Microscopes (SEMs). While SEMs typically magnify samples up to 1–2 million times, TEMs surpass this by orders of magnitude, allowing for visualization of structures at the atomic level. This extreme magnification is crucial for detailed analysis in various fields, including materials science, biology, and nanotechnology.
